Testing micromodules

customized automatic testing machine

  • wafer level testing process
  • testing capabilities for FP/DFB/VCSEL/PIN/APD chips
  • easy adaptation for different wafer layouts
  • testing temperature range from +25ºC to +110ºC
  • testing wavelength range from 850nm to 1630nm
  • 100% electrical testing of all chips on the wafer
  • wafer mapping functionality (position, status)
  • comparison of data before and after burn in
  • measurement data storage in local database
  • measurement data traceability for each chip
  • stability/repeatibility verification by master wafers
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