Testing micromodules
customized automatic testing machine
- wafer level testing process
- testing capabilities for FP/DFB/VCSEL/PIN/APD chips
- easy adaptation for different wafer layouts
- testing temperature range from +25ºC to +110ºC
- testing wavelength range from 850nm to 1630nm
- 100% electrical testing of all chips on the wafer
- wafer mapping functionality (position, status)
- comparison of data before and after burn in
- measurement data storage in local database
- measurement data traceability for each chip
- stability/repeatibility verification by master wafers