Testing micromodules

customized automatic testing machine

• wafer level testing process
• testing capabilities for FP/DFB/VCSEL/PIN/APD chips
• easy adaptation for different wafer layouts
• testing temperature range from +25ºC to +110ºC
• testing wavelength range from 850nm to 1630nm
• 100% electrical testing of all chips on the wafer
• wafer mapping functionality (position, status)
• comparison of data before and after burn in
• measurement data storage in local database
• measurement data traceability for each chip
• stability/repeatibility verification by master wafers